Functional Test

The functional testing section of a board description is used to indicate to XJTAG that the specified nets and/or devices have been tested in some way. This is just used when XJTAG generates test coverage figures during a DFT analysis and can be used in two ways:

• To indicate that a particular set of nets and/or devices have been tested through some other function method (e.g. running code on the processor to test the nets/devices).
• To separate a set of untested nets/devices so that the designer can concentrate on other untested items.

Syntax

FUNCTIONAL TEST
    TestName
        [ netName | deviceReference.pinNum | deviceReference.ALL ] { , ... } ;
    END;

    ...
END;

If the syntax "deviceReference.ALL" is used, all the pins on that device are assumed to be functionally tested.

Example

FUNCTIONAL TEST
    "Power Supply Test"
        FB, AB, IC12.5, U7.ALL;
    END;

    // Just stop XJTAG from outputting these nets as untested!
    "Untested Clock nets"
        CLK1, CLK2, CLK3;
    END;
END;