▶ Introduction
- What is XJTAG?
- Software Components
- ▶ Installation Details
▶ Concepts
- Boards and Netlists
- BSDL Files
- IEEE JTAG standards
- JTAG Chains
- JTAG Instructions
- JTAG Test Access Port
- TMS Reset Operation
- Classifying Nets
- ▶ How XJTAG interacts with your hardware
- ▶ Dynamic Chains
- Scan Modes
- Multicore Devices
- Passive Device Types
- Safe Bitstream
- ▶ Constant Pins and Bus Disable Values
- Variants
▶ Hardware
- XJLink-PF20
- XJLink-PF40
- XJLink2
- XJQuad
- PXI-XJLink2
- XJLink2-3030
- XJLink2-3070
- XJLink2-CFM
- Original XJLink
- ▶ Preset Pin Mappings
- XJDemo Board
- ▶ XJIO board
▶ Licensing
- XJLink based licensing
- Network licensing
- Licensing Errors
▶ Tutorials
- ▶ XJDeveloper Tutorial
- ▶ XJRunner Tutorial
- ▶ XJAnalyser Tutorial
- ▶ XJDeveloper tutorial for boards without netlists
▶ XJTAG User Guide
- ▶ Setting Up a Physical JTAG Chain
- ▶ Entering Board Information
- ▶ Connections and Disconnects
- ▶ Power, Ground and Termination Nets
- ▶ Defining JTAG Chains
- ▶ Working with Dynamic Chains
- ▶ Categorising Devices
- ▶ Creating Test Device Files
- ▶ Managing XJEase Library Updates
- ▶ Test Lists and XJRunner Settings
  - ▶ Setting up a Test List
  - ▶ XJRunner Settings
- ▶ Explorer and Viewers
- ▶ Sharing XJTAG Projects
- ▶ Revisions
- ▶ Using XJIntegration
▶ XJDeveloper
- XJDeveloper User Interface
- ▶ Screens
  - Start Screen
  - ▶ Boards Screen
  - ▶ Connections Screen
  - Power/Ground Nets Screen
  - ▶ JTAG Chain Screen
  - ▶ Categorise Devices Screen
  - Constant Pins Screen
  - Passive Device Files Screen
  - ▶ Test Device Files Screen
  - ▶ Logic Files Screen
  - ▶ Circuit Code Files Screen
    - Standard Globals
  - ▶ Variants Screen
  - ▶ Test Coverage Screen
  - ▶ Pin Mapping Screen
  - Analyser Screen
  - Debug Connection Test Screen
  - ▶ XJRunner Setup Screen
    - XJRunner Tests
    - Edit Test Group Dialog
    - ▶ Edit Test Function Dialog
    - Add/Edit Condition Dialog
    - Suggested Tests Dialog
    - Variant-Profile Mapping Dialog
    - ▶ XJRunner Test List
    - ▶
      Settings Tabs
  - Run Tests Screen
- ▶ Menus and Toolbar items
  - File Menu
  - Edit Menu
  - View Menu
  - Tools Menu
  - Help Menu
  - Other Menus
  - Toolbar Features
- ▶ Options Dialog
  - ▶ Options
  - Regular Expression Editor
- ▶ Helper Panes
  - Assistant Pane
  - Errors Pane
  - Warnings Pane
  - Uncategorised Devices Pane
  - Notes Pane
  - Breakpoints Pane
  - History Pane
- ▶ Test Code Editor
  - Editor Keystrokes
  - Find and Replace Dialog
- ▶ Explorer
  - Overview
  - Finding Pins, Devices and Nets
  - Explorer Tabs
  - Primary Navigation Panel
  - Logic And Connection Panel
  - Details Panel
  - Graphical Navigation Panel
  - JTAG Access
- Save Project As...
- XJPack Dialog
- Zip Project Dialog
- BSDL Editor
- Connection Test Output Viewer
- Company Part Numbers Translator
- Import SPEA Leonardo Project Dialog
- Project Compatibility Report
- Docking Windows
- ▶ Project Files
  - XJEase modules
- ▶ XJEase Library
  - XJEase Library Browser
  - Updating the XJTAG Library
  - Updated Library Files Dialog
  - Saving Library Files
  - User-Defined Libraries
- ▶ Debugging Tests
  - Breakpoints
  - XJEase Watch Window
  - Call Stack Window
  - ▶ XJEase Waveform View
- ▶ Revisions
  - New Revision Dialog
  - Revise Board Dialog
  - Revision Checklist
  - Revision Source Project View Options
  - Revision Device Matching Algorithm
  - Updating Revised Device References
- ▶
  Circuit Visualisation
  - Viewing Devices
  - Viewing Nets
  - Viewing Pins
▶ XJEase Language
- XJEase Keyword Reference
- ▶ Types, Operators and Expressions
- Comments
- END
- ▶ Flow Control
- ▶ Functions and Program Structure
- ▶
  Built-in functions
- SET statement
- HOLDOFF
- ▶ Default Overrides
  - SET_DEFAULT_OVERRIDE
  - RESET_DEFAULT_OVERRIDE
- ▶ Raw JTAG Access
- ▶ SWD Protocol
- ▶ XJEaseDocs
  - ▶ Function Docs
  - ▶ File Docs
- Deprecated Language Features
- ▶ Warnings
- ▶ Running Functions after Test Functions
  - Post-Function
  - Post-Testing Function
- ▶ Serial Numbers in XJRunner
  - SERIAL_NUMBER
- Accelerating JTAG chain accesses
▶ XJAnalyser
- ▶ Overview
- ▶ XJAnalyser Reference
  - ▶ Project Setup
    - ▶ Power/Pin Mapping and Test Reset Sequence Setup
      - Pin Mapping
      - Test Reset Sequence
    - Device Configuration
  - ▶ Menus and Toolbar Items
    - ▶ File Menu
      - Import Project...
      - Save Project As...
    - View Menu
    - ▶ Project Menu
      - Setting Chain Frequency
    - Scan Menu
    - ▶ Tools Menu
      - ▶ Options Dialog
        
        Interface Options
        
        Files Options
        
        Colour Options
        
        Test Output Options
    - Help Menu
    - Toolbar Features
    - Set Pin Value Menu
  - ▶ Windows
  - ▶ Dialogs
  - ▶ Explorer
- ▶ JTAG Concepts
  - BSDL Files
  - ▶ Configuration of JTAG Device Modes
    - BYPASS
    - CLAMP
    - EXTEST
    - HIGHZ
    - SAMPLE
  - JTAG Speed Limitations
- ▶ Support
  - ▶ Troubleshooting
▶ XJRunner
- Starting XJRunner
- Login Dialog
- ▶ Options Dialog
- ▶ User Management
  - User Privileges
- ▶ Project Management
  - XJRunner Tests
  - ▶ Settings
    - Test Output
    - Functions
    - ▶ Log File
      - Editing Log Formats
    - Runtime Dialogs
    - Serial Number
    - Fault Dictionary
    - Messages
    - Notes
- ▶ Running Tests
- Menus
- Toolbar
- Command-line Arguments
- XJPack Files
- XJRunner Recorder
- ▶ XJRun command-line runner
▶ XJInvestigator
- Starting XJInvestigator
- Login Dialog
- ▶ XJInvestigator Reference
▶ JTAG Chain Debugger
- ▶ Pin Mappings
- ▶ JTAG Chain Debugger Reference
- ▶ Using the JTAG Chain Debugger
▶ Layout Viewer
- Layers
- Selectors
- Menu Items
- Toolbar Features
- Measure Dialog
- Tracking Dialog
- Edit Image Dialog
- Layout Viewer Options
▶ Schematic Viewer
- ▶ Menus and Toolbar items
- ▶ Tools
- ▶ Search
  - Netlist Search
  - Text Search
▶ Log Files
- XJTAG Log Files
- ▶ Log File Format
- ▶ Log File Viewer
▶ BSDL Library
- BSDL File Library Browser
- Adding files
- Organising files in the library
- BSDL files with custom cell types
- Selecting Files From the BSDL Library
▶ XJEase Library Editor
- XJEase Library Editor
- Starting XJEase Library Editor
- ▶ User Interface
  - Categories Panel
  - ▶ Files Panel
    - File Operations
    - File Statuses
  - Details Panel
  - ▶ Menus and Toolbar item
- ▶ Importing Files From XJDeveloper Projects
- Building
- Syntax Checking
- Hidden Files
- Library Editor Tips
▶ Common UI Elements
- Netlist Search
- Docking
▶ XJFlash
- Preparing to use XJFlash
- ▶ Configuring XJFlash
- Creating the FPGA image
- Selecting the programming files
- Programming the flash
- Reading back the flash contents
▶ Utilities
- ▶ XJLink Manager
- ▶ XJVersion
  - Checking version numbers
  - Managing File Associations
- XJPack
▶ Troubleshooting
- ▶ Project Setup
  - BSDL Files
  - EDIF Netlist Problems
- ▶ JTAG Chain Bring-up
  - JTAG Chain Errors
  - Compliance Patterns
- ▶ Connection Test Problems
- ▶ XJEase Troubleshooting
- ▶ Signal Integrity
- ▶ Technical Support
▶ XJIntegration (.NET Framework API)
- ▶ XJIntegration API Overview
  - XJAnalyser Integration
  - ▶ XJRunner Integration
    - Getting Started
    - Run Sessions, Logging and Resetting Variables
- Deployment
- Migrating from XJRunnerIntegration.dll to XJIntegration.dll
- ▶ LabVIEW
- Using XJIntegration.dll in a C# project
- Minimum Requirements
- ▶ API Reference
▶ XJAPI Reference
- Deployment
- Interface version
- ▶ Data types
- ▶ Functions
- Example code
- Chain padding in XJTAG
▶ Third Party Integration
- Third Party Integration
- ▶ SPEA
  - Running XJTAG Tests From Leonardo
  - Execution of Leonardo ICT Test plan tasks
- ▶ Takaya
- ▶ Keysight i3070
Acknowledgements

time-taken Element

The time-taken element indicates how long a test function or the whole of the test run took to run.

Parent

Inner Text

The time taken in milliseconds.