Test Groups

A Test Group is a set of Test Functions that form a logical unit. For example, if you have a number of identical devices on a board, each of which has a test functions, then it would make sense to group these test functions together.

Each test group in the test list must have a unique name.

A test group may also have a profile (or profiles in a Variants project) associated with it.

Test groups are configured in the Edit Test Group dialog from the XJRunner Setup screen.

Variants

In projects with variants defined, a test group can be given different behaviour per variant. This allows a single test list to be shared between all the variants in a project, with test groups enabled or disabled as necessary to reflect the devices fitted on the board.

Each test group in a variants project stores a list of variants that will run, defined in the Variant Selection dialog. By default all test groups will run in all variants, however if some devices are missing from a variant, it is recommended to put tests for these devices into a group or groups that do not run. When running tests on the Run Tests screen, test groups that do not run in the currently selected variant will be hidden from the test list.

If a variants project also uses Dynamic Chains then each test group now has a variant-profile mapping, defined in the Variant-Profile Mapping dialog. The test group must specify for each variant, whether this test group should run, and if so, which profile it should run in. By default all variants will use the same profile when running a test group.

N.B. The option to set up different profiles per variant is primarily for the case where you have variations to JTAG devices in your project. See the Vary JTAG Device dialog page for more information about setting up JTAG variations.