XJRunner Integration
The XJRunner Integration allows you to utilise the functionality of your XJRunner test system from within your own application or test executive. XJIntegration provides a selection of interfaces and classes that contain methods, events and properties which help you to test your board.
Methods are available through the API which allow either the full XJRunner Test List to be run as a whole, or for individual test functions to be run. Tests are exposed to the integration such that they can be configured in the same way as is possible through XJRunner. This means that individual tests or test groups can be enabled, disabled or set to loop repeatedly, and conditions can be overridden.
There are several other features which allow the integration to be configured as required:
- Override subchain TCK frequencies.
- Switch formatted and plain text logging on or off.
- Set whether or not tests continue to run after test failures.
- Get or set STRING or INT XJEase global variables.
- Run any global XJEase circuit code function or test device function, even if it is not a test function.
XJTAG v4.1.100