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Reviewing Test Coverage

You can review the test coverage that your test system will achieve at any stage of your setup.

  • Click Test Coverage under Setup.

The columns which are shown in the Summary Statistics tab of the Test Coverage screen can be configured by clicking Columns... in the bottom-right corner (see image below).

Test Coverage Summary Statistics

N.B. Throughout this tutorial the Only display coverage from enabled tests option, in the Coverage Options panel, should be selected.

For more information on using the Test Coverage screen, see the Test Coverage tutorial exercise.

You can see from the Summary Statistics that of the 792 (Total column) pins on the board, only 53 (Tested column) will be tested by running the Connection Test at this stage. This coverage will be increased as you give XJDeveloper more information about the other devices on the XJDemo board.

You can see test coverage superimposed on the PCB layout if you wish: click Test Coverage Data in Layout Viewer and select Tested Pins. At this stage test coverage is very limited, including only pins on nets which connect the two JTAG devices, along with the TAP nets used for JTAG communication.

To allow testing of more nets that are accessible from the JTAG chain, the other devices in the circuit that are connected to the JTAG enabled devices have to be categorised.