TEST COVERAGE Section

The TEST COVERAGE section describes how each of the pins and busses is tested in the XJEase functions, and is used in DFT analysis. Any of the following can be used, separated by a space.

For pins/busses that can be directly read / written to from a JTAG pin, use the following categories to add to the automatically calculated connection test coverage:

• SHORTS - the pin/bus is directly tested for short circuit errors.
• OPEN - the pin/bus is directly tested for open circuit errors.
• HI - the pin/bus is directly tested for shorts to a power rail ('stuck high').
• LO - the pin/bus is directly tested for shorts to a ground rail ('stuck low').

For pins/busses that are not accessible from any JTAG pin, use the following.

• FUNCTIONAL - the pin/bus is not accessible from any JTAG pin, but its basic functionality has been confirmed.

Note: The TEST COVERAGE descriptions 'READ', 'WRITE' and 'BIDIR' have been discontinued. Replace them with 'OPEN FUNCTIONAL' instead.